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Abstract
Cognitive and skills diagnosis models are psychometric models that have immense potential to provide rich information relevant for instruction and learning. However, wider applications of these models have been hampered by their novelty and the lack of commercially available software that can be used to analyze data from this psychometric framework. To address this issue, this article focuses on one tractable and interpretable skills diagnosis model—the DINA model—and presents it didactically. The article also discusses expectation-maximization and Markov chain Monte Carlo algorithms in estimating its model parameters. Finally, analyses of simulated and real data are presented.
References
| Baker, FB Item response theory: Parameter estimation techniques1992New YorkDekker Google Scholar | |
| Bradley, CP, Louis, TA Bayes and empirical Bayes method for data analysis20002nd edLondonChapman & Hall Google Scholar | |
| de la Torre, J, Douglas, J Higher-order latent trait models for cognitive diagnosisPsychometrika200469333353 Google Scholar | Crossref | |
| de la Torre, J, Douglas, J Modeling multiple strategies in cognitive diagnosis2005AprilPaper presented at the annual meeting of the National Council on Measurement in EducationMontréal, Québec, Canada Google Scholar | |
| Doignon, JP, Falmagne, JC Knowledge spaces1999New YorkSpringer-Verlag Google Scholar | Crossref | |
| Doornik, JA Object-Oriented Matrix Programming Using Ox (Version 3.1)2002LondonTimberlake Consultants Press[Computer software] Google Scholar | |
| Embretson, S A general latent trait model for response processesPsychometrika198449175186 Google Scholar | Crossref | |
| Embretson, SE, Reise, SP Item response theory for psychologists2000Mahwah, NJLawrence Erlbaum Google Scholar | |
| Fu, J, Li, Y An integrative review of cognitively diagnostic psychometric models2007AprilPaper presented at the annual meeting of the National Council on Measurement in EducationChicago Google Scholar | |
| Haertel, EH Using restricted latent class models to map the skill structure of achievement itemsJournal of Educational Measurement198926333352 Google Scholar | Crossref | |
| Hartz, S A Bayesian framework for the unified model for assessing cognitive abilities: Blending theory with practicality2002University of Illinois at Urbana-ChampaignUnpublished doctoral dissertation Google Scholar | |
| Junker, BW, Sijtsma, K Cognitive assessment models with few assumptions, and connections with nonparametric item response theoryApplied Psychological Measurement200125258272 Google Scholar | SAGE Journals | |
| Leighton, JP, Gierl, MJ, Hunka, S The attribute hierarchy model: An approach for integrating cognitive theory with assessment practiceJournal of Educational Measurement200441205236 Google Scholar | Crossref | |
| Macready, GB, Dayton, CM The use of probabilistic models in the assessment of masteryJournal of Educational Statistics197733379416 Google Scholar | |
| Maris, E Estimating multiple classification latent class modelsPsychometrika199964187212 Google Scholar | Crossref | |
| Neyman, J, Scott, EL Consistent estimates based on partially consistent observationsEconometrika194816661679 Google Scholar | Crossref | |
| Tatsuoka, C Data-analytic methods for latent partially ordered classification modelsJournal of the Royal Statistical Society: Series C (Applied Statistics)200251337350 Google Scholar | Crossref | |
| Tatsuoka, K A probabilistic model for diagnosing misconceptions in the pattern classification approachJournal of Educational Statistics1985125573 Google Scholar | |
| Tatsuoka, KK Frederiksen, N, Glaser, R, Lesgold, A, Safto, M Toward an integration of item-response theory and cognitive error diagnosisMonitoring skills and knowledge acquisition1990Hillsdale, NJErlbaum453488 Google Scholar | |
| van der Linden, WJ, Hambleton, RK Handbook of modern item response theory1997New YorkSpringer-Verlag Google Scholar | Crossref | |
| Zimowski, MF, Muraki, E, Mislevy, RJ, Bock, RD BILOG-MG: Multiple-group IRT analysis and test maintenance for binary items1996ChicagoScientific Software Google Scholar |
